Improve the accuracy of your force data

AFM force data is highly dependent upon cantilever spring constant values. Based on their own data, manufacturer reported values for this characteristic can vary as widely as plus/minus 50%. This variation can significantly affect the data you collect. Novascan now offers the opportunity to improve the accuracy of your force data in a fast, easy, non-destructive manner with the Novascan PCM-90 probe calibration module.

For information regarding Probe Calibration Systems and system prices, please fill out the "Contact Me" section at the bottom of this page.

Benefits

• Universal design integrates with any AFM
• Performs thermal and resonance quality factor calibrations
• For rectangular and triangular levers
• USB connectivity; BNC Inputs

References

Sader, John E., Chon, James W. M., Mulvaney, Paul. Calibration of Rectangular Atomic Force Microscope Cantilevers. Review of Scientific Instruments. Volume 70 Number 10. October 1999

Hutter, Jeffrey L. and Bechhoefer, John. Calibration of Atomic-Force Microscope Tips. Review of Scientific Instruments. Volume 64 Number 7. July 1993

Sader, John Elie. Parallel Beam Approximation for V-shaped Atomic Force Microscope Cantilevers. Review of Scientific Instruments. Volume 66 Number 9. September 1995

Clifford, Charles A. and Seah, Martin P. The Determination of Atomic Force Microscope Cantilever Spring Constants Via Dimensional Methods for Nanomechanical Analysis. Nanotechnology. Institute of Physics Publishing.