Atomic Force Microscopes, AFM Force Spectroscopy / Measurement, Novascan UV Ozone Cleaners, AFM Bead probes, AFM Chemical Probes, AFM Spring Constant Calibration, Anti-Vibration Acoustic Isolation> </div> <div style=
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
History
1981 STM developed by Binnig, Rohrer, Gerber, and Weibel at IBM-Zurich
1982 Atomic resolution demonstrated by Binnig on Si(7x7)
1984 Near-field Optical Microscope developed
1985 AFM developed by Binnig, Gerber, and Quate at IBM-Zurich/Standford University
1986 Nobel Prize in physics awarded to Bennig & Rohrer for development of the STM
1987 Noncontact AFM introduced
MFM developed
1988 Commercial AFM available
1990 Individual atoms are manipulated
1991 Microfabricated AFM probes are introduced
1992 Piezolevers are introduced
Shear-force detection type NSOM/SNOM are introduced
2003 President Bush signs Nanotechnology Research & Development Act
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
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