Atomic Force Microscopes, AFM Force Spectroscopy / Measurement, Novascan UV Ozone Cleaners, AFM Bead probes, AFM Chemical Probes, AFM Spring Constant Calibration, Anti-Vibration Acoustic Isolation>
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atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
Lateral Force Microscopy

Lateral Force Microscopy (LFM) differs from AFM because it uses a position-sensitive photodetector (PSPD) to detect the lateral defection of the cantilever rather than the vertical deflection. An LFM's PSPD is divided into quadrants (A-D), rather than an AFM's halves, to allow for the sensation of the later components of the cantilevers deflection. A system can generate both LFM and AFM data simultaneously if it is engineered properly.

These lateral deflections of the cantilever result from forces parallel to the plane of the sample surface. This can be caused by changes in surface friction or slope. LFM is useful for imaging these surface variations.

atomic force microscope uv ozone cleaner afm probe tip acoustic isolator
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